Vol 4: Absence of Evidence Evidence of Absence: Statistical Analysis of Inclusions in Multiferroic Thin Films.Reportar como inadecuado



 Vol 4: Absence of Evidence Evidence of Absence: Statistical Analysis of Inclusions in Multiferroic Thin Films.


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This article is from Scientific Reports, volume 4.AbstractAssertions that a new material may offer particularly advantageous properties should always be subjected to careful critical evaluation, especially when those properties can be affected by the presence of inclusions at trace level. This is particularly important for claims relating to new mu

Autor: Schmidt, Michael; Amann, Andreas; Keeney, Lynette; Pemble, Martyn E.; Holmes, Justin D.; Petkov, Nikolay; Whatmore, Roger W.

Fuente: https://archive.org/







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