DTIC ADA052433: Semiconductor Device Damage Assessment for the INCA Program-A Probabilistic Approach.Reportar como inadecuado



 DTIC ADA052433: Semiconductor Device Damage Assessment for the INCA Program-A Probabilistic Approach.


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Two methods are described for estimating the probability that a given semiconductor device will be damaged by an electrical transient. Both methods are based on existing device damage data which were obtained by step-stressing devices to failure, using rectangular pulses. Both methods require calculation of the time-dependent power waveform in the

Autor: Defense Technical Information Center

Fuente: https://archive.org/







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