DTIC ADA017400: Damage Profiles in Silicon and Their Impact on Device ReliabilityReportar como inadecuado



 DTIC ADA017400: Damage Profiles in Silicon and Their Impact on Device Reliability


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This report describes work dealing with improvements of advanced measurement techniques. Chapter 1 deals with the computer generation of Kikuchi patterns needed for complex structural analysis of crystal defects in silicon. The program is applicable to a large variety of problems and can be used to generate Kikuchi maps for different crystal struct

Autor: Defense Technical Information Center

Fuente: https://archive.org/







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