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Abstract: In the paper, an evolutionary approach to test generation for functional BISTis considered. The aim of the proposed scheme is to minimize the test datavolume by allowing the device-s microprogram to test its logic, providing anobservation structure to the system, and generating appropriate test data forthe given architecture. Two methods of deriving a deterministic test set atfunctional level are suggested. The first method is based on the classicalgenetic algorithm with binary and arithmetic crossover and mutation operators.The second one uses genetic programming, where test is represented as asequence of microoperations. In the latter case, we apply two-point crossoverbased on exchanging test subsequences and mutation implemented as randomreplacement of microoperations or operands. Experimental data of the programrealization showing the efficiency of the proposed methods are presented.



Autor: Y.A.Skobtsov, D.E.Ivanov, V.Y.Skobtsov, R.Ubar, J.Raik

Fuente: https://arxiv.org/







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