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Analytical Electron Tomography

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Publication Date: 2016-07-07

Journal Title: MRS Bulletin

Publisher: Cambridge University Press

Volume: 41

Issue: 7

Pages: 531-536

Language: English

Type: Article

This Version: AM

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Citation: Leary, R. K., & Midgley, P. A. (2016). Analytical Electron Tomography. MRS Bulletin, 41 (7), 531-536.

Description: This is the author accepted manuscript. The final version is available from Cambridge University Press via

Abstract: This short review highlights recent advances in analytical electron tomography (AET), the 3D extension of conventional nano-analytical techniques, in which electron energy-loss and X-ray spectroscopy and electron diffraction are combined with tomographic acquisition and reconstruction. We show key examples from the literature illustrating how new 3D information, gleaned from AET, provides insights into not just morphology and composition, but also the electronic, chemical and optical properties of materials at the nanoscale. We describe how the ‘multi-dimensional’ nature of AET leads to ‘big data’ sets, how these can be analyzed optimally and look forward to how AET may develop further.

Keywords: scanning transmission electron microscopy (STEM), nanoscale, electron energy loss spectroscopy (EELS), x-ray tomography, crystallographic structure

Sponsorship: The research leading to these results has received funding from the European Union Seventh Framework Programme under Grant Agreement 312483-ESTEEM2 (Integrated Infrastructure Initiative–I3), as well as from the European Research Council under the European Union’s Seventh Framework Programme (FP/2007-2013)/ERC grant agreement 291522-3DIMAGE. RKL acknowledges a Junior Research Fellowship at Clare College.


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Autor: Leary, Rowan K.Midgley, Paul A.



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