A solution in 3 dimensions for current in a semiconductor under high level injection from a point contact - Condensed Matter > Other Condensed MatterReport as inadecuate




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Abstract: The standard equations for semiconductor device analysis were solved byspecifying the electron and hole current injected at a small contact, assuminghigh-level injection. Calculated current-voltage characteristics were fit tomeasurements of a single point breakdown in an ultrathin dielectric. It wasfound that the minority carrier injection level was about 70%.



Author: Mike W. Denhoff

Source: https://arxiv.org/







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