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Abstract : The essentials of X-ray interferometry and its principal application fields are reviewed. Very small lattice disturbances which are present even in highest quality crystals of silicon have been investigated by ordinary and moire topography. Strains corresponding to Δd-d variations of 10 -7 are found in large perfect crystals.

Keywords : Interferometry XRD Moire fringes Fluctuations Lattice parameters Perfect crystals Investigation method

Autor: U. Bonse W. Graeff G. Materlik

Fuente: https://hal.archives-ouvertes.fr/


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