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ElectroComponent Science and Technology - Volume 7 1981, Issue 4, Pages 217-220

Laboratoire d-Electronique, Université de Nancy-I, C.O. 140, Nancy-Cedex 54037, France

Received 1 October 1979

Copyright © 1981 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Starting from the effective Fuchs–Sondheimer model of electronic conduction in thin polycrystalline films andimplementing the asymptotic expressions of conductivity it is shown that the hypothesis of temperature independenceof the grain boundary reflection coefficient agrees with previously published results.





Autor: C. R. Pichard, A. J. Tosser, and C. R. Tellier

Fuente: https://www.hindawi.com/



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