RESOLUTION OF FIELD-ION MICROSCOPY VERSUS SCANNING TUNNELLING MICROSCOPY FOR OBTAINING SURFACE CHARGE DENSITY CORRUGATIONSReportar como inadecuado




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Abstract : Our investigations of the resolution of the field-ion microscope FIM and the scanning tunnelling microscope, based on calculations of charge density above a structured metal surface represented by a jellium model, indicate that better resolution may be expected in the FIM. We suggest that FIM can be used to determine the corrugation of the charge density above a surface and hence to elucidate the structure of a surface unit cell.





Autor: D. Kingham N. Garcia

Fuente: https://hal.archives-ouvertes.fr/



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