Characterization of BSO crystals. A preliminary studyReport as inadecuate

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Abstract : Czochralski grown bismuth silicon oxide BSO crystals have been investigated by mean of synchrotron X-ray topography in order to study the quality of the crystals obtained. High quality single crystals can be obtained under conditions rather deviated from the equilibrium. The first results correlating the defects observed with the type of the interface are reported.

Author: J. Martínez M. González-Mañas M. Caballero E. Diéguez B. Capelle



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