Non-contact Microelectronic Device Inspection Systems And MethodsReportar como inadecuado


Non-contact Microelectronic Device Inspection Systems And Methods


Non-contact Microelectronic Device Inspection Systems And Methods - Descarga este documento en PDF. Documentación en PDF para descargar gratis. Disponible también para leer online.

Non-contact microelectronic device inspection systems and methods are discussed and provided. Some embodiments include a method of generating a virtual reference device or chip. This approach uses a statistics to find devices in a sample set that are most similar and then averages their time domain signals to generate the virtual reference. Signals associated with the virtual reference can then be correlated with time domain signals obtained from the packages under inspection to obtain a quality signature. Defective and non-defective devices are separated by estimating a beta distribution that fits a quality signature histogram of inspected packages and determining a cutoff threshold for an acceptable quality signature. Other aspects, features, and embodiments are also claimed and described.



Georgia Tech Patents -



Autor: Ume, Ifeanyi Charles - Valdes, Abel - Gong, Jie - Ahmad, Razid - -

Fuente: https://smartech.gatech.edu/







Documentos relacionados