DEPTH CONTROLLED EXAFS AND NEAR EDGE SPECTROSCOPY TO STUDY SURFACE LAYER STRUCTUREReport as inadecuate




DEPTH CONTROLLED EXAFS AND NEAR EDGE SPECTROSCOPY TO STUDY SURFACE LAYER STRUCTURE - Download this document for free, or read online. Document in PDF available to download.



Abstract : Calculated and experimental intensity values are presented and compared for EXAFS spectrometry at grazing incidence with fluorescence or reflectivity detection, and samples in the form of single or double metal films evaporated onto flat glass substrates.





Author: F. Thornley G. Antonini G. Greaves N. Barrett

Source: https://hal.archives-ouvertes.fr/



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