SURFACE EXAFS AND XANES STUDIES OF S-Ni 110 AND S-Ni 111Report as inadecuate




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Abstract : S K-edge SEXAFS were measured on c2x2S-Ni110 and S-Ni111 by monitoring the S KLL Auger intensity as a function of photon energy and polarization direction. Analysis of the data from c2x2S-Ni110 gave results that a sulfur atom is located on a hollow site with RS-top layer Ni of 2.31±0.02 Å and RS-bottom Ni of 2.19±0.03 Å. These results are in close agreement with the recent analysis of LEED. From the preliminary SEXAFS work on p2x2S-Ni 111, S-nearest neighbor Ni bond distance was determined to be 2.20±0.04 Å.





Author: T. Ohta Y. Kitajima P. Stefan M. Shek Stefan N. Kosugi H. Kuroda

Source: https://hal.archives-ouvertes.fr/



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