Atomic structure of vitreous interfacial films in sialonReportar como inadecuado

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1 MAT - Centre des Matériaux

Abstract : Atomic resolution imaging of siliceous interfacial films in a sialon has been achieved using transmission electron microscopy at 1000 KV. Although such films have always been reputed as vitreous, we show that they are at least partially crystallized. An atomic model is proposed and simulated. The stability of these films is discussed when special crystallographic relationships exist between the two adjacent grains.

Autor: A. Thorel - J. Laval Daniel Broussaud -



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