Effects of Electropulsing Induced Microstructural Changes on THz-Reflection and Electrical Conductivity of Al-Doped ZnO Thin-FilmsReportar como inadecuado




Effects of Electropulsing Induced Microstructural Changes on THz-Reflection and Electrical Conductivity of Al-Doped ZnO Thin-Films - Descarga este documento en PDF. Documentación en PDF para descargar gratis. Disponible también para leer online.

Electropulsing induced phase transformation and crystal orientation change and their effects on electrical conductivity, THz reflection and surface roughness of thin-films of Al2O3 2 wt% doped ZnO were studied using XRD, SEM, AFM and Thz spectroscopy techniques. AZO-2 thin-films showed an effective response in THz spectroscopy under electropulsing. Electropulsing induced circular preferred crystal orientation changes and phase transformations were observed. The preferred crystal orientation changes accompanying decrease in stress and the secondary phase precipitation favored enhancing conductivity and THz reflection of the AZO-2 thin-films. After adequate electropulsing, both THz reflection and electrical conductivity of the thin-films were enhanced by 22.8% and 6.8%, respectively; meanwhile surface roughness reduced. The property responses of electropulsing are discussed from point view of microstructural change and dislocation dynamics.

KEYWORDS

Electropulsing, Precipitation, Preferred Crystal Orientation, THz Reflection, Electrical Conductivity, AZO Thin-Films

Cite this paper

Zhu, Y. and Lai, W. 2016 Effects of Electropulsing Induced Microstructural Changes on THz-Reflection and Electrical Conductivity of Al-Doped ZnO Thin-Films. Journal of Surface Engineered Materials and Advanced Technology, 6, 106-117. doi: 10.4236-jsemat.2016.63010.





Autor: Yaohua Zhu1*, Weien Lai2

Fuente: http://www.scirp.org/



DESCARGAR PDF




Documentos relacionados