Ellipsometric $in~situ$ study of the titanium surfaces during the anodizationReportar como inadecuado

Ellipsometric $in~situ$ study of the titanium surfaces during the anodization - Descarga este documento en PDF. Documentación en PDF para descargar gratis. Disponible también para leer online.

Abstract : The titanium surfaces immersed in 0.5 mol.dm-3 H2SO4 and anodized in the voltage region from 0 to 100 V have been studied by in situ ellipsometric measurements. The thickness, inhomogeneity, and porosity of the formed films rise with increasing applied voltage. A computational method is presented for obtaining both the refractive indices and thickness of an unknown film on a reflecting substrate of know optical constants. The complex index of refraction and thickness of generated films were calculated comparing the theoretical computed curve with experimental loci Δ and Ψ obtained from in situ ellipsometric measurements.

Autor: A. Efremova Lj. Arsov

Fuente: https://hal.archives-ouvertes.fr/


Documentos relacionados