Superconducting depression in thin films of yba2cu3o7-¿ based on the variation of the relative humidity and the time Reportar como inadecuado




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W. Saldarraiga ; F. Pérez ; J. -G. Ramírez ; M. E. Gómez ; P. Prieto ; C. Cortés-Escobedo ;Superficies y vacío 2007, 20 (3)

Autor: J. C. Caicedo

Fuente: http://www.redalyc.org/


Introducción



Superficies y vacío ISSN: 1665-3521 alex@fis.cinvestav.mx Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. México Caicedo, J.
C.; Saldarraiga, W.; Pérez, F.; Ramírez, J.
-G.; Gómez, M.
E.; Prieto, P.; CortésEscobedo, C. Superconducting depression in thin films of YBa2Cu3O7-¿ based on the variation of the relative humidity and the time Superficies y vacío, vol.
20, núm.
3, septiembre, 2007, pp.
6-10 Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. Distrito Federal, México Available in: http:--www.redalyc.org-articulo.oa?id=94220302 How to cite Complete issue More information about this article Journals homepage in redalyc.org Scientific Information System Network of Scientific Journals from Latin America, the Caribbean, Spain and Portugal Non-profit academic project, developed under the open access initiative ©Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales Superficies y Vacío 20(3),6-10, septiembre de 2007 Superconducting depression in thin films of YBa2Cu3O7-δ based on the variation of the relative humidity and the time J.
C.
Caicedo, W.
Saldarraiga, F.
Pérez*, J.
– G.
RamírezM.
E.
Gómez1, P.
Prieto 1.
Grupo de Películas Delgadas, Universidad del Valle, Cali – Colombia * Universidad Tecnológica de Pereira C.
Cortés-Escobedo Centro de Investigación e Innovación Tecnológica del IPN –México (Recibido: 16 de octubre de 2006; Aceptado: 5 de marzo de 2007) Thin films of YBa2Cu3O7-δ grown on SrTiO3 (100) single crystal substrates by sputtering DC technique to high oxygen pressures were put under different conditions of relative humidity from 24 to 100% and different times of exposition.
The electrical, morphologic and structural characteristics of the films by means of curves R-T, atomic force microscopy (AFM) and X-ray diffraction (XRD) were analyzed.
The effect on structural and transport properties with the environmental conditions of relative humidity an...





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