New Method of Vapour Discrimination Using the Thickness Shear Mode TSM ResonatorReportar como inadecuado




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Nanotechnology Research Laboratories, School of Engineering, Sheffield Hallam University, City Campus, Pond Street, Sheffield, S1 1WB, UK





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Abstract The Impedance analysis technique complimented with curve fitting software was used to monitor changes in film properties of Thickness Shear Mode TSM resonator on vapour exposure. The approach demonstrates how sensor selectivity can be achieved through unique changes in film viscosity caused by organic vapour adsorption. View Full-Text

Keywords: Impedance Analysis; QCM; TSM resonator; BVD model Impedance Analysis; QCM; TSM resonator; BVD model





Autor: A. F. Holloway * , A. Nabok, M. Thompson, A. K. Ray, D. Crowther and J. Siddiqi

Fuente: http://mdpi.com/



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