Fault Localization Method by Partitioning Memory Using Memory Map and the Stack for Automotive ECU Software TestingReportar como inadecuado


Fault Localization Method by Partitioning Memory Using Memory Map and the Stack for Automotive ECU Software Testing


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Department of Electrical and Computer Engineering, Ajou University, Suwon 16499, Korea





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Academic Editor: Antonio Maffucci

Abstract Recently, the usage of the automotive Electronic Control Unit ECU and its software in cars is increasing. Therefore, as the functional complexity of such software increases, so does the likelihood of software-related faults. Therefore, it is important to ensure the reliability of ECU software in order to ensure automobile safety. For this reason, systematic testing methods are required that can guarantee software quality. However, it is difficult to locate a fault during testing with the current ECU development system because a tester performs the black-box testing using a Hardware-in-the-Loop HiL simulator. Consequently, developers consume a large amount of money and time for debugging because they perform debugging without any information about the location of the fault. In this paper, we propose a method for localizing the fault utilizing memory information during black-box testing. This is likely to be of use to developers who debug automotive software. In order to observe whether symbols stored in the memory have been updated, the memory is partitioned by a memory map and the stack, thus the fault candidate region is reduced. A memory map method has the advantage of being able to finely partition the memory, and the stack method can partition the memory without a memory map. We validated these methods by applying these to HiL testing of the ECU for a body control system. The preliminary results indicate that a memory map and the stack reduce the possible fault locations to 22% and 19% of the updated memory, respectively. View Full-Text

Keywords: Electronic Control Unit ECU; automotive software; fault localization; embedded testing; memory map; Hardware in the Loop HiL; memory update Electronic Control Unit ECU; automotive software; fault localization; embedded testing; memory map; Hardware in the Loop HiL; memory update





Autor: Kwanhyo Kim, Ki-Yong Choi and Jung-Won Lee *

Fuente: http://mdpi.com/



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