XMCD characterization of rare-earth dopants in Ni$ {81}$Fe$ {19}$50nm: microscopic basis of engineered dampingReportar como inadecuado



 XMCD characterization of rare-earth dopants in Ni$ {81}$Fe$ {19}$50nm: microscopic basis of engineered damping


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We present direct evidence for the contribution of local orbital moments to the damping of magnetization precession in magnetic thin films. Using x-ray magnetic circular dichroism XMCD characterization of rare-earth RE M$ {4,5}$ edges in Ni$ {81}$Fe$ {19}$ doped with $



Autor: W. E. Bailey; L. Cheng; H. Song

Fuente: https://archive.org/







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