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 Vol 9: Structural and optical properties of ITO-TiO2 anti-reflective films for solar cell applications.


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This article is from Nanoscale Research Letters, volume 9.AbstractIndium tin oxide ITO and titanium dioxide TiO2 anti-reflective coatings ARCs were deposited on a 100 P-type monocrystalline Si substrate by a radio-frequency RF magnetron sputtering. Polycrystalline ITO and anatase TiO2 films were obtained at room temperature RT. The thickness of ITO 60 to 64 nm and TiO2 55 to 60 nm films was optimized, considering the optical response in the 400- to 1,000-nm wavelength range. The deposited films were characterized by X-ray diffraction XRD, Raman spectroscopy, field emission scanning electron microscopy FESEM, energy dispersive spectroscopy EDS, and atomic force microscopy AFM. The XRD analysis showed preferential orientation along 211 and 222 for ITO and 200 and 211 for TiO2 films. The XRD analysis showed that crystalline ITO-TiO2 films could be formed at RT. The crystallite strain measurements showed compressive strain for ITO and TiO2 films. The measured average optical reflectance was about 12% and 10% for the ITO and TiO2 ARCs, respectively.



Autor: Ali, Khuram; Khan, Sohail A; Jafri, Mohd Zubir Mat

Fuente: https://archive.org/



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