SAXS Structural Characterization of Nanoheterogeneous Conducting Thin Films. A Brief Review of SAXS Theories - Physics > Atomic and Molecular ClustersReportar como inadecuado




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Abstract: The SAXS small angle X-ray scattering technique has been used to determinethe fundamental structure of conducting thin films fabricated by implantinggold ions into PMMA polymethylmethacrylate polymer. We present a brief reviewof the SAXS theories necessary to determine the structural properties of ournanoheterogeneous films.



Autor: M. Cattani, M.C. Salvadori, F.S. Teixeira

Fuente: https://arxiv.org/



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