Calibration of O IV 26 micron as a Measure of Intrinsic AGN Luminosity - Astrophysics > Cosmology and Nongalactic AstrophysicsReportar como inadecuado




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Abstract: We compare O IV 25.89 micron emission line luminosities with very hard10-200 keV X-rays from Swift, Integral, and BeppoSAX for a complete sample of89 Seyferts from the Revised Shapley-Ames sample. Using Seyfert 1s, wecalibrate O IV as a measure of AGN intrinsic luminosity, for particular usein high-obscuration environments. With this calibration, we measure the averagedecrement in 14-195 keV X-ray to O IV luminosity ratio for Seyfert 2scompared to type 1s. We find a decrement of 3.1 +- 0.8 for Seyfert 2s, and adecrement of 5.0 +- 2.7 for known Compton-thick Seyfert 2s. These decrementsimply column densities of approximately log NH=24.6 and 24.7 cm^-2,respectively. Thus, we infer that the average Seyfert 2 is more highly obscuredand intrinsically more luminous than would be inferred even from the very hardX-rays. We demonstrate two applications of the hard X-ray to O IV ratio. Wemeasure a column density for the extremely obscured NGC 1068 of logNH=25.3-25.4 cm^-2. Finally, by comparing O IV luminosities to totalinfrared luminosities for twelve bright ultraluminous infrared galaxies, wefind that four have substantial AGN contributions.



Autor: J. R. Rigby 1, A. M. Diamond-Stanic 2, G. Aniano 3 1 Carnegie Observatories, 2 University of Arizona, 3 Princeton University

Fuente: https://arxiv.org/







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