Statistical leakage estimation in 32nm CMOS considering cells correlationsReportar como inadecuado

Statistical leakage estimation in 32nm CMOS considering cells correlations - Descarga este documento en PDF. Documentación en PDF para descargar gratis. Disponible también para leer online.

1 ST-CROLLES - STMicroelectronics Crolles 2 CEA-LETI - Laboratoire d-Electronique et des Technologies de l-Information 3 MISTIS - Modelling and Inference of Complex and Structured Stochastic Systems Inria Grenoble - Rhône-Alpes, LJK - Laboratoire Jean Kuntzmann, INPG - Institut National Polytechnique de Grenoble

Abstract : In this paper a method to estimate the leakage power consumption of CMOS digital circuits taking into account input states and process variations is proposed. The statistical leakage estimation is based on a pre-characterization of library cells considering correlations ρ between cells leakages. A method to create cells leakage correlation matrix is introduced. The maximum relative error achieved in the correlation matrix is 0.4% with respect to the correlations obtained by Monte Carlo simulations. Next the total circuit leakage is calculated from this matrix and cells leakage means and variances. The accuracy and efficiency of the approach is demonstrated on a C3540 8 bit ALU ISCAS85 Benchmark circuit.

Autor: Smriti Joshi - Anne Lombardot - Marc Belleville - Edith Beigne - Stephane Girard -



Documentos relacionados