A First Step for an INL Spectral-Based BIST: The Memory OptimizationReport as inadecuate




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1 SysMIC - Conception et Test de Systèmes MICroélectroniques LIRMM - Laboratoire d-Informatique de Robotique et de Microélectronique de Montpellier 2 NXP Semiconductors 3 GREYC - Groupe de Recherche en Informatique, Image, Automatique et Instrumentation de Caen

Abstract : Integral non-linearity INL is the main static parameter of analog-to-digital converter. This paper presents a comparison between different INL test techniques based on INL estimation from the spectrum of the converted signal. The most common technique is based on polynomial fitting of the INL curve. This technique is well suited to the estimation of a smooth INL curve without sharp transitions. The new method described in the paper is based on a Fourier series expansion of the INL curve. We demonstrate that this new technique allows a more efficient INL estimation. The comparison between the two techniques has been realized thanks to a metrics that considers the uncertainty of production test measurements. Finally, we propose a first step of the study of implementation feasibility of the INL estimation technique. This study focus only on the optimization of required memory.

Keywords : fast Fourier transform Fourier series expansion analog-to-digital converter testing integral non-linearity polynomial fitting





Author: Vincent Kerzérho - Serge Bernard - Philippe Cauvet - Jean-Marie Janik -

Source: https://hal.archives-ouvertes.fr/



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