Finite Element Simulation and X-Ray Microdiffraction Study of Strain Partitioning in a Layered NanocompositeReportar como inadecuado




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Journal of Crystallography - Volume 2016 2016, Article ID 4351347, 11 pages -

Research Article

Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA

Mechanical Science and Engineering Department, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA

National Center for Supercomputing Applications, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA

Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA

Received 28 February 2016; Accepted 4 May 2016

Academic Editor: Laszlo Toth

Copyright © 2016 R. I. Barabash et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The depth-dependent strain partitioning across the interfaces in the growth direction of the NiAl-CrMo nanocomposite between the Cr and NiAl lamellae was directly measured experimentally and simulated using a finite element method FEM. Depth-resolved X-ray microdiffraction demonstrated that in the as-grown state both Cr and NiAl lamellae grow along the direction with the formation of as-grown distinct residual ~0.16% compressive strains for Cr lamellae and ~0.05% tensile strains for NiAl lamellae. Three-dimensional simulations were carried out using an implicit FEM. First simulation was designed to study residual strains in the composite due to cooling resulting in formation of crystals. Strains in the growth direction were computed and compared to those obtained from the microdiffraction experiments. Second simulation was conducted to understand the combined strains resulting from cooling and mechanical indentation of the composite. Numerical results in the growth direction of crystal were compared to experimental results confirming the experimentally observed trends.





Autor: R. I. Barabash, V. Agarwal, S. Koric, I. Jasiuk, and J. Z. Tischler

Fuente: https://www.hindawi.com/



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