A Fully Integrated 32 nm MultiProbe for Dynamic PVT Measurements within Complex Digital SoCReportar como inadecuado




A Fully Integrated 32 nm MultiProbe for Dynamic PVT Measurements within Complex Digital SoC - Descarga este documento en PDF. Documentación en PDF para descargar gratis. Disponible también para leer online.

1 CEA-LETI - Laboratoire d-Electronique et des Technologies de l-Information 2 SysMIC - Conception et Test de Systèmes MICroélectroniques LIRMM - Laboratoire d-Informatique de Robotique et de Microélectronique de Montpellier

Abstract : This paper deals with the design of a compact Process, Voltage and Temperature PVT probe architecture, in 32nm CMOS technology. The sensor, hereafter named MultiProbe, is composed of 7 different ring oscillators, each one presenting a particular sensitivity to PVT variations. The architecture allows MultiProbes to be chained, so that a single controller is needed. Simulation results exhibit the non-linearity behavior of the ring oscillators under temperature and voltage variations as well as their particular behavior. Due to their small size, the Multiprobe blocks can be easily integrated within a complex digital SoC architecture.

Keywords : multiprobe power management voltage drop variability AVFS DVFS calibration digital sensors low-power architecture monitoring temperature ring oscillator





Autor: Lionel Vincent - Edith Beigne - Laurent Alacoque - Suzanne Lesecq - Catherine Bour - Philippe Maurine -

Fuente: https://hal.archives-ouvertes.fr/



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