A Multi-Converter DFT Technique for Complex SIP: Concepts and ValidationReportar como inadecuado




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1 SysMIC - Conception et Test de Systèmes MICroélectroniques LIRMM - Laboratoire d-Informatique de Robotique et de Microélectronique de Montpellier 2 NXP Semiconductors

Abstract : This paper presents a new technique called -Analog Network of Converters- that allows to test a set of ADCs and DACs embedded in a complex circuit as SiP and SoC. It presents an experimental validation of this new concept that permits to reduce drastically the testing time and requires only a low cost digital ATE.

Keywords : Mixed-signal testing DFT ADC DAC





Autor: Vincent Kerzérho - Philippe Cauvet - Serge Bernard - Florence Azaïs - Mariane Comte - Michel Renovell -

Fuente: https://hal.archives-ouvertes.fr/



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