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International Journal of Photoenergy - Volume 2016 2016, Article ID 5306925, 7 pages -

Research Article

School of Science, Xi’an Jiaotong University, Xi’an 710049, China

Yingli Group Co., Ltd., Baoding 071051, China

Received 2 April 2016; Revised 21 August 2016; Accepted 30 August 2016

Academic Editor: Simona Binetti

Copyright © 2016 He Wang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Based on the theory of material mechanics and thermal stress analysis, the stress distribution of combined electrode for crystalline silicon solar module was studied for the first time. The shear stress and normal stress distribution of soldered structure for crystalline silicon solar cells under the thermal field were discussed. And the results show that the stress distribution is not simply linear relationship as some results found. But there is a stress concentration at the edge, which was considered as the true reason that caused microcracks at the edge of soldered solar cells. The conclusions we got in this paper provide a theoretical basis for deceasing the breakage rates of soldered crystalline silicon solar cells and improving the reliability of crystalline silicon solar modules.





Autor: He Wang, Ao Wang, Hong Yang, and Dengyuan Song

Fuente: https://www.hindawi.com/



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