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1 ECE Dept. 2 Mentor Graphic Corporation 3 ECE - School of Electrical and Computer Engineering West Lafayette

Abstract : A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The proposed method can be used with any test generation procedure to improve the effectiveness of the tests in detecting un-modeled defects. Experimental results on several industrial designs show the effectiveness of defect aware tests. We also propose a measure to estimate the effectiveness of given test sets in detecting un-modeled defects.





Autor: Huaxing Tang - Gang Chen - Sudhakar M. Reddy - Chen Wang - Janusz Rajski - Irith Pomeranz -

Fuente: https://hal.archives-ouvertes.fr/



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