Optical and Morphological Studies of Thermally Evaporated PTCDI-C8 Thin Films for Organic Solar Cell ApplicationsReportar como inadecuado




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International Journal of PhotoenergyVolume 2013 2013, Article ID 205105, 7 pages

Research Article

Lane Department of Computer Science and Electrical Engineering, West Virginia University, Morgantown, WV 26506, USA

Department of Physics, West Virginia University, Morgantown, WV 26506, USA

Received 28 November 2012; Accepted 25 February 2013

Academic Editor: Himadri S. Majumdar

Copyright © 2013 Ronak Rahimi et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

PTCDI-C8 due to its relatively high photosensitivity and high electron mobility has attracted much attention in organic semiconductor devices. In this work, thin films of PTCDI-C8 with different thicknesses were deposited on silicon substrates with native silicon dioxide using a vacuum thermal evaporator. Several material characterization techniques have been utilized to evaluate the structure, morphology, and optical properties of these films. Their optical constants refractive index and extinction coefficient have been extracted from the spectroscopic ellipsometry SE. X-ray reflectivity XRR and atomic force microscopy AFM were employed to determine the morphology and structure as well as the thickness and roughness of the PTCDI-C8 thin films. These films revealed a high degree of structural ordering within the layers. All the experimental measurements were performed under ambient conditions. PTCDI-C8 films have shown to endure ambient condition which allows pots-deposition characterization.





Autor: Ronak Rahimi, V. Narang, and D. Korakakis

Fuente: https://www.hindawi.com/



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