Electrical Conductance of Bolted Copper Joints for Cryogenic ApplicationsReportar como inadecuado




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* Corresponding author 1 UBT - Ultra-basses températures NEEL - Institut Néel

Abstract : We present the results of electric contact resistance measurements at low temperatures on copper-to-copper bolted joints.
Our accurate and systematic data display a rather small dispersion, and maybe a useful tool for cryogenic applications like pulse-tubes, dilution refrigerators and nuclear refrigerators.


Keywords : Copper joints Conductance Low temperature Cryogenics





Autor: Florent Blondelle - Ahmad Sultan - Eddy Collin - Henri Godfrin -

Fuente: https://hal.archives-ouvertes.fr/



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