A simple method of measuring profiles of thin liquid films for microfluidics experiments by means of interference reflection microscopy - Physics > OpticsReportar como inadecuado




A simple method of measuring profiles of thin liquid films for microfluidics experiments by means of interference reflection microscopy - Physics > Optics - Descarga este documento en PDF. Documentación en PDF para descargar gratis. Disponible también para leer online.

Abstract: A simple method was developed to observe the interference patterns of thelight reflected by the interfaces of thin liquid films. Employing a fluorescentmicroscope with epi-illumination, we collected the 2D patterns of interferencefringes containing information of the liquid film topography at microscale. Todemonstrate the utility of the proposed visualization method we developed aframework for reconstructing the profiles of liquid films by analysing thereflected interferograms numerically. Both the visualization and reconstructionmethods should be useful for variety of microfluidic applications involving theflows with droplets and bubbles in which the knowledge of the topography of theinterfacial liquid film is critical.



Autor: V. Berejnov, D. Li

Fuente: https://arxiv.org/







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