High-resolution electron backscatter diffraction in III-nitride semiconductorsReportar como inadecuado




High-resolution electron backscatter diffraction in III-nitride semiconductors - Descarga este documento en PDF. Documentación en PDF para descargar gratis. Disponible también para leer online.

Reference: Vilalta-Clemente, A, Naresh-Kumar, G, Nouf Allehiani, M et al., (2015). High-resolution electron backscatter diffraction in III-nitride semiconductors.Citable link to this page:

 

High-resolution electron backscatter diffraction in III-nitride semiconductors Subtitle: Microscopy and Microanalysis 2015 Proceedings

Peer Review status:Peer reviewedPublication status:PublishedVersion:Accepted Manuscript Funder: Engineering and Physical Sciences Research Council   Conference Details: Microscopy and MicroanalysisNotes:Copyright © 2015 Microscopy Society of America. This is the accepted manuscript version of the paper. The final version is available online from Cambridge University Press at: http://dx.doi.org/10.1017/S1431927615011861

Bibliographic Details

Publisher: Cambridge University Press

Publisher Website: http://journals.cambridge.org/

Host: Microscopy and Microanalysissee more from them

Publication Website: http://journals.cambridge.org/action/displayJournal?jid=MAM

Issue Date: 2015

pages:2217-2218Identifiers

Urn: uuid:519dd050-2a97-4325-9a9f-01b898365dda

Source identifier: 606773

Eissn: 1435-8115

Doi: https://doi.org/10.1017/S1431927615011861

Issn: 1431-9276 Item Description

Type: Conference;

Version: Accepted Manuscript Tiny URL: pubs:606773

Relationships





Autor: Vilalta-Clemente, A - institutionUniversity of Oxford Oxford, MPLS, Materials - - - Naresh-Kumar, G - - - Nouf Allehiani, M - - -

Fuente: https://ora.ox.ac.uk/objects/uuid:519dd050-2a97-4325-9a9f-01b898365dda



DESCARGAR PDF




Documentos relacionados