Regret analysis for performance metrics in multi-label classification: the case of Hamming and subset zero-one lossReportar como inadecuado




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(2010)LECTURE NOTES IN ARTIFICIAL INTELLIGENCE.6321.p.280-295 Mark

Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-1155381



Autor: Krzysztof Dembszynski, Willem Waegeman , Weiwei Cheng and Eyke Hüllermeier

Fuente: https://biblio.ugent.be/publication/1155381



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