Andreev reflection measurements in nanostructures with amorphous WC$ x$ superconducting contacts - Condensed Matter > SuperconductivityReportar como inadecuado




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Abstract: Point-contact Andreev reflection measurements of Co- and Cu-tungsten-carbideWC$ x$ contacts are presented. Metallic thin films were patterned bye-beam-lithography and lift-off; tungsten carbide superconducting tips weregrown directly on the pre-patterned samples by decomposition of ametallo-organic vapour tungsten hexacarbonyl under a focused Ga$^+$-ion beamFIB. Current-voltage measurements as a function of temperature and magneticfield clearly showed the signatures of Andreev reflection. The experimentalconductance-voltage curves were analyzed within the Blonder-Tinkham-Klapwijktheory. The results highlight the possibilities, advantages and disadvantagesof using FIB-produced amorphous WC$ x$ tips for point-contact spectroscopy inmetallic nanostructures.



Autor: J. Barzola-Quiquia, M. Ziese, P. Esquinazi, N. Garcia

Fuente: https://arxiv.org/







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