TEM characterization of the reaction products formed in Al–Cu-SiO2 couples due to high temperature interactionReportar como inadecuado

TEM characterization of the reaction products formed in Al–Cu-SiO2 couples due to high temperature interaction - Descarga este documento en PDF. Documentación en PDF para descargar gratis. Disponible también para leer online.

Journal of Materials Science

, Volume 47, Issue 24, pp 8464–8471

First Online: 28 August 2012Received: 04 May 2012Accepted: 11 August 2012


Classical sessile drop experiment was performed for intensive microstructure and phase composition studies of the reaction product region RPR formed because of high temperature interaction between the aluminum–copper alloy Al—16.7 at.% Cu and SiO2 amorphous substrate. The experiment was performed in vacuum at 1173 K for 2 hour contact time. Scanning and transmission electron microscopy techniques were applied to reveal the details of the complex microstructure of reactively formed product zone at the drop-substrate interface. Three regions of different structure and phase composition were well distinguished in the RPR: the first layer was composed of large-faced Al2O3 crystals of alpha type surrounded by the Al2Cu metallic channels, the second one had the same phase composition but different morphology of the alpha alumina and with silicon as an extra component dissolved within these phases and as precipitates. The third area revealed very fine-grained 100–200 nm microstructure, in which Al2Cu and Si grains were embedded in orthorhombic δ-Al2O3 matrix. Moreover, the presence of the deformation twins in silicon, twinned on 1–11 plane was related to large strains present in the area close to the SiO2 substrate and coming from the volumetric mismatch of SiO2 and the freshly formed Al2O3.

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Autor: Joanna Wojewoda-Budka - Natalia Sobczak - Lidia Litynska-Dobrzynska - Boguslaw Onderka - Rafal Nowak

Fuente: https://link.springer.com/

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