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Abstract: We report development of a quantum Hall resistance standard accurate to a fewparts in a billion at 300 mK and based on large area epitaxial graphene. Theremarkable precision constitutes an improvement of four orders of magnitudeover the best results obtained in exfoliated graphene and is similar to theaccuracy achieved in well-established semiconductor standards. Unlike thetraditional resistance standards the novel graphene device is still accuratelyquantized at 4.2 K, vastly simplifying practical metrology. This breakthroughwas made possible by exceptional graphene quality achieved with scalablesilicon carbide technology on a wafer scale and shows great promise for futurelarge scale applications in electronics.



Autor: Alexander Tzalenchuk, Samuel Lara-Avila, Alexei Kalaboukhov, Sara Paolillo, Mikael Syväjärvi, Rositza Yakimova, Olga Kazakova,

Fuente: https://arxiv.org/



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